Work

Impact of back biasing on carrier transport in ultra-thin-body and BOX (UTBB) Fully Depleted SOI MOSFETs

Year: 2012

Type: conference-paper

Source: Symposium on VLSI Technology

DOI: 10.1109/vlsit.2012.6242487

Authors: Nuo Xu, Francois Andrieu, Byron Ho, Bich-Yen Nguyen, Olivier Weber, Carlos Mazuré, Olivier Faynot, Thierry Poiroux, Tsu-Jae King Liu

Institutions: University of California, Berkeley, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information, Soitec (France)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1998565749

FWCI: 4.063

Cites: 4

Cited by: 24

Related to: 10