A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI
Year: 1996
Type: article
Source: Journal of Electronic Testing
DOI: 10.1007/bf00137568
Authors: Johan Verfaillie, Didier Haspeslagh
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1998669267
