Work

Comments on "Source-and-drain series resistance of LDD MOSFET's"

Year: 1984

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/edl.1984.26015

Authors: C. Duvvury, D.A.G. Baglee, M.P. Duane

Institution: Texas Instruments (United States)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1998672335

FWCI: 1.151

Cites: 7

Cited by: 4

Related to: 10