Work

Characterisation of organic field effect transistor structures by micro-Raman spectroscopy, AFM and XRD methods

Year: 2008

Type: conference-paper

Source: International Conference on Advanced Semiconductor Devices and Microsystems

DOI: 10.1109/asdam.2008.4743331

Authors: Rudolf Smanek, Jaroslav Kovac, Jan Jakabovic, Gert Irmer, Edmund Dobrocka, Daniel Hasko

Institutions: Slovak University of Technology in Bratislava, TU Bergakademie Freiberg, Institute of Electrical Engineering of the Slovak Academy of Sciences, International Laser Center

Language: English

Topic: Organic Electronics and Photovoltaics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Agentúra na Podporu Výskumu a Vývoja

OpenAlex ID: W1999489043

FWCI:

Cites: 5

Cited by: 1

Related to: 10