Work

A hierarchically defined fault pattern generator using genetic algorithm

Year: 2010

Type: article

Source: International Journal of Adaptive and Innovative Systems

DOI: 10.1504/ijais.2010.032276

Authors: Dhiraj Sangwan, Rajesh Kumar, Mukesh Kumar

Institution: Mody University of Science and Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000541235

FWCI:

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Cited by: 1

Related to: 10