Work

Thickness dependence of signal/background ratio of inner-shell electron excitation loss in eels

Year: 1984

Type: article

Source: Ultramicroscopy

DOI: 10.1016/0304-3991(84)90211-0

Authors: Jun Hosoi, Tetsuo Oikawa, Masao Inoue, Yasushi Kokubo

Institution: JEOL (Japan)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000574282

FWCI: 0.319

Cites: 10

Cited by: 9

Related to: 10