Work

Controllability and Fault Observability in Modular Combinational Circuits

Year: 1978

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/tc.1978.1674968

Author: Cerny

Institutions: Concordia University, Université de Montréal

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000650323

FWCI: 1.244

Cites: 8

Cited by: 12

Related to: 10