Hot-electron and hole-emission effects in short n-channel MOSFET's
Year: 1985
Type: article
Authors: K.R. Hofmann, C. Werner, W. Weber, G. Dorda
Institutions: Siemens (Germany), Siemens (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2000806993