Work

Estimation of Carrier Suppression by High-Energy Boron-Implanted Layer for Soft Error Reduction

Year: 1994

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.33.7148

Authors: Takehisa Kishimoto, Hirokazu Sayama, Mikio Takai, Yoshikazu Ohno, Kenichirou Sonoda, Tadashi Nishimura, Atsushi Kinomura, Yuji Horino, Kanenaga Fujii

Institutions: The University of Osaka, Mitsubishi Electric (Japan), National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2003183128

FWCI: 2.397

Cites: 9

Cited by: 6

Related to: 10