A new method to characterize the thermomechanical response of multilayered structures in power electronics
Year: 2006
Type: article
Source: Microelectronics Reliability
Authors: P. Zimprich, T. Licht, B. Weiss
Institutions: University of Vienna, Infineon Technologies (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W2004110042
