Characterization of polycrystalline layers by channelling measurements
Year: 1973
Type: article
Source: Thin Solid Films
Authors: D. Sigurd, R.W. Bower, W.F. Van Der Weg, J.W. Mayer
Institution: California Institute of Technology
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2006944599