Work

Growth, characterization and electrical properties of epitaxial erbium silicide

Year: 1990

Type: article

Source: Thin Solid Films

DOI: 10.1016/0040-6090(90)90424-c

Authors: F. Arnaud d'Avitaya, P.-A. Badoz, Y. Campidelli, J.A. Chroboczek, J.-Y. Duboz, A. Perio, J. Pierre

Institutions: Centre National de la Recherche Scientifique, Institut Néel

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007229150

FWCI: 8.069

Cites: 24

Cited by: 64

Related to: 10