Work

Scanning x-ray diffraction with 200nm spatial resolution

Year: 2008

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.2929374

Authors: M. Hanke, M. Dubslaff, M. Schmidbauer, T. Boeck, S. Schöder, M. Burghammer, C. Riekel, J. Patommel, C. G. Schroer

Institutions: Martin Luther University Halle-Wittenberg, Leibniz Institute for Crystal Growth, European Synchrotron Radiation Facility, Technische Universität Dresden

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007442863

FWCI: 6.976

Cites: 12

Cited by: 53

Related to: 10