Work

Algorithms for an Advanced Fault Simulation System in MOTIS

Year: 1987

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.1987.1270267

Authors: Chi-Yuan Lo, H.N. Nham, A.K. Bose

Institution: AT&T (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007455520

FWCI: 0.38

Cites: 15

Cited by: 29

Related to: 10