Work

Determination of the refractive index of In0.53Al0.11Ga0.36As on InP in the wavelength range from 280 to 1900 nm by spectroscopic ellipsometry

Year: 1993

Type: article

Source: Applied Surface Science

DOI: 10.1016/0169-4332(93)90533-h

Authors: H.W. Dinges, H. Burkhard, R. Lösch, H. Nickel, W. Schlapp

Institution: Deutsche Bundespost

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2009023074

FWCI: 0.246

Cites: 5

Cited by: 3

Related to: 10