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Automated test bitstream generation for an SOI-based FPGA

Year: 2010

Type: conference-paper

Source: IEEE International Conference on Solid-State and Integrated Circuit Technology

DOI: 10.1109/icsict.2010.5667840

Authors: Yan Li, Stanley L. Chen, Liang Chen, Qianli Zhang, Ming Li

Institutions: Chinese Academy of Sciences, Institute of Semiconductors

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2010798191

FWCI: 0.18

Cites: 2

Cited by: 1

Related to: 10