FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
Year: 2006
Type: conference-paper
Authors: Bin Zhang, Wei-Shen Wang, M. Orshansky
Institution: The University of Texas at Arlington
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2010966375