Work

Researches of Test Nodes Selection of Analog Circuit

Year: 2012

Type: conference-paper

Source: International Conference on Computer Science and Electronics Engineering (ICCSEE)

DOI: 10.1109/iccsee.2012.367

Authors: Qing-yao Xu, Shao-hui Cui, Lu-jie Han, Shi-jie Deng

Institution: Ordnance Engineering College

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2012081236

FWCI:

Cites: 3

Cited by:

Related to: 10