Work

Computer Simulation of Point-Defect Fields and Microdefect Patterns in Czochralski-Grown Si Crystals

Year: 2002

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.41.464

Authors: Nikolai I. Puzanov, Anna M. Eidenzon, Dmitri N. Puzanov, Jun Furukawa, Kazuhiro Harada, Naoki Ono, Yasushi Shimanuki

Institution: Mitsubishi Materials (Japan)

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2013043816

FWCI: 0.344

Cites: 4

Cited by: 2

Related to: 10