Work

Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47 - xAs on InP in the wavelength range from 280 to 1900 nm

Year: 1993

Type: article

Source: Thin Solid Films

DOI: 10.1016/0040-6090(93)90077-3

Authors: H.W. Dinges, H. Burkhard, R. Lösch, H. Nickel, W. Schlapp

Institution: Deutsche Bundespost

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2015013860

FWCI: 0.638

Cites: 6

Cited by: 7

Related to: 10