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Reference metrology in a research fab: the NIST clean calibrations thrust

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Year: 2009
Type: conference-paper
Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
DOI: 10.1117/12.815499
Authors: Ronald Dixson, Joe Fu, Ndubuisi Orji, Thomas Renegar, Alan Zheng, Theodore Vorburger, Al Hilton, Marc Cangemi, Lei Chen, Mike Hernandez, Russell Hajdaj, Michael Bishop, Aaron Cordes
Institution: National Institute of Standards and Technology
Language: English

Topic: Advanced Measurement and Metrology Techniques
Subfield: Mechanical Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: National Institute of Standards and Technology
OpenAlex ID: W2015951677
FWCI: 2.837
Cites: 25
Cited by: 4
Related to: 10
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