Work

A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance

Year: 2010

Type: conference-paper

Source: Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference

DOI: 10.1109/isscc.2010.5433922

Authors: James Tschanz, Keith Bowman, Shih-Lien Lu, Paolo Aseron, Muhammad Khellah, Arijit Raychowdhury, Bibiche Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De

Institution: Intel (United States)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2016301038

FWCI: 11.55

Cites: 5

Cited by: 65

Related to: 10