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Comparison of thermally and mechanically induced Si layer transfer in hydrogen-implanted Si wafers

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Year: 2003
Type: article
Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
DOI: 10.1016/j.nimb.2003.11.043
Authors: T. Höchbauer, A. Misra, M. Nastasi, K. Henttinen, T. Suni, I. Suni, S.S. Lau, W. Ensinger
Institutions: Los Alamos National Laboratory, VTT Technical Research Centre of Finland, University of California San Diego, Philipps University of Marburg
Language: English

Topic: Ion-surface interactions and analysis
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences

Open Access status: closed

Funder: Basic Energy Sciences
OpenAlex ID: W2016915263
FWCI: 1.506
Cites: 11
Cited by: 20
Related to: 10
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