A precise-tracking NBTI-degradation monitor independent of NBTI recovery effect
Year: 2010
Type: conference-paper
Authors: Eisuke Saneyoshi, Koichi Nose, Masayuki Mizuno
Institution: NEC (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2016958650