Work

RF measurements and characterization of heterostructure field-effect transistors at low temperatures

Year: 1989

Type: article

Source: IEEE Transactions on Microwave Theory and Techniques

DOI: 10.1109/22.32221

Authors: W. Brockerhoff, H. Meschede, W. Prost, K. Heime, G. Weimann, W. Schlapp

Institutions: University of Duisburg-Essen, RWTH Aachen University, Deutsche Bundespost, Technical University of Munich

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2018447364

FWCI: 2.835

Cites: 17

Cited by: 16

Related to: 10