Work

Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes

Year: 1996

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.490913

Authors: M. Takai, T. Kishimoto, Y. Ohno, H. Sayama, K. Sonoda, S. Satoh, T. Nishimura, H. Miyoshi, A. Kinomura, Y. Horino, K. Fujii

Institutions: The University of Osaka, Mitsubishi Electric (Japan), National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2018656067

FWCI: 2.33

Cites: 40

Cited by: 18

Related to: 10