Work

Architecture of built-in self-test and recovery memory chips

Year: 2013

Type: conference-paper

Source: IEEE East-West Design & Test Symposium (EWDTS)

DOI: 10.1109/ewdts.2013.6673185

Authors: V.A. Andrienko, Moamar Diaa, V.G. Ryabtsev, T.Yu. Utkina

Institutions: Cherkasy State Technological University, European University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2020351673

FWCI: 0.19

Cites: 2

Cited by: 5

Related to: 10