Work

Measurement of second order susceptibilities of GaN and AlGaN

Year: 2005

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.1852695

Authors: N. A. Sanford, A. V. Davydov, D. V. Tsvetkov, A. V. Dmitriev, S. Keller, U. K. Mishra, S. P. DenBaars, S. S. Park, J. Y. Han, R. J. Molnar

Institutions: National Institute of Standards and Technology, University of California, Santa Barbara, Samsung (South Korea), Samsung Advanced Institute of Technology (South Korea), MIT Lincoln Laboratory

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2034433276

FWCI: 2.289

Cites: 31

Cited by: 77

Related to: 10