Work

Single-electron injections in fringing-field-induced charge-trapping memories

Year: 2013

Type: article

Source: Microelectronic Engineering

DOI: 10.1016/j.mee.2013.06.014

Authors: K.H. Chiang, S.W. Chou, H.C. Hsu, E.S. Jeng

Institution: Chung Yuan Christian University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2053790829

FWCI: 0.589

Cites: 21

Cited by: 5

Related to: 10