Author

Erik S. Jeng

Observed names: E. Jeng, E. S. Jeng, E.S. Jeng, Erik Jeng
OpenAlex ID: A5111278277
2011 · Chipta P. Laksana, Meei-ru Chen, et al. · IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 24
2004 · C.S. Hsieh, P.C. Kao, et al. · IEEE Transactions on Electron Devices · 22
2009 · Yuan-Feng Chen, Jeng Gong, et al. · IEEE Transactions on Electron Devices · 14
2002 · W. Y. Chiu, C. H. Wu, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 10
2007 · Erik S. Jeng, Chia-Sung Chiu, et al. · IEEE Transactions on Electron Devices · 8
2006 · E.S. Jeng, Pai-Chun Kuo, et al. · IEEE Transactions on Electron Devices · 8
2023 · Bo-Wen Lai, Chu-Cheng Li, et al. · IEEE International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB) · 6
2017 · E.S. Jeng, S.W. Chou, et al. · Microelectronics Journal · 5
2013 · K.H. Chiang, S.W. Chou, et al. · Microelectronic Engineering · 5
2016 · Jhong-Jyun. Cai, H. X. Chen, et al. · International Symposium on Next-Generation Electronics · 4
2014 · Erik S. Jeng, Chen-Chia Fan, et al. · Japanese Journal of Applied Physics · 2
2007 · Y. J. Lai, C. S. Yang, et al. · Applied Physics Letters · 2
2024 · Yung-Yen Chou, Bo-Wen Lai, et al. · IEEE International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB)
2021 · Chia-Yu Kuo, Yu-Hao Huang, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2021 · Shang-Wei Chou, Chia-Yu Kuo, et al. · IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
2016 · Yi-Ling Wei, H. X. Chen, et al. · International Symposium on Next-Generation Electronics
2015 · S.W. Chou, H.X. Chen, et al. · International Conference on Informatics, Electronics & Vision (ICIEV)
2010 · Chipta P. Laksana, Meei-Ru Chen, et al. · IEEE Conference on Industrial Electronics and Applications (ICIEA)
2009 · Chia-Sung Chiu, Ching-Chun Chang, et al. · Japanese Journal of Applied Physics
2008 · C. S. Chiu, G. C. Chang, et al. · International Conference on Solid State Devices and Materials (SSDM)
2002 · B.-R. Sheu, K.-H. Wu, et al. · International Symposium on Plasma Process-Induced Damage
Works count: 25
Citation count: 141
H-index: 7
I10-index: 5
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