Work

Resampling of SEM-EDS Element Maps to Assess the Length-Scale of Elemental Heterogeneity

Year: 2009

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927609094525

Authors: C Todd, W Heeschen, A Pyzik, C Han

Institution: Dow Chemical (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2059633518

FWCI:

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