Ultrahigh B doping (<~1022cm−3) during Si(001) gas-source molecular-beam epitaxy: B incorporation, electrical activation, and hole transport
Year: 2000
Type: article
Authors: G. Glass, H. Kim, P. Desjardins, N. Taylor, T. Spila, Q. Lu, J. E. Greene
Institution: University of Illinois Urbana-Champaign
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2062633705
