Structural properties and electrical characteristics of electron-beam gun evaporated erbium oxide films
Year: 2002
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.1456267
Authors: V. Mikhelashvili, G. Eisenstein, F. Edelmann
Institution: Technion – Israel Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2063552579