Work

Effect of surface roughness on EPES and AREPES measurements: Flat and crenels silicon surfaces

Year: 2008

Type: article

Source: Surface Science

DOI: 10.1016/j.susc.2008.04.020

Authors: S. Chelda, C. Robert-Goumet, B. Gruzza, L. Bideux, G. Monier

Institutions: Centre National de la Recherche Scientifique, Institut Pascal, Université Blaise Pascal

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2064591998

FWCI: 1.198

Cites: 27

Cited by: 15

Related to: 10