Work

Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications

Year: 2001

Type: article

Source: Review of Scientific Instruments

DOI: 10.1063/1.1344596

Authors: O. Jbara, M. Belhaj, S. Odof, K. Msellak, E. I. Rau, M. V. Andrianov

Institutions: Centre National de la Recherche Scientifique, Russian Academy of Sciences, Lomonosov Moscow State University, Institute of Microelectronics Technology and High Purity Materials

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2069191024

FWCI: 2.859

Cites: 25

Cited by: 57

Related to: 10