Work

A simple parameter extraction method for ultra-thin oxide MOSFETs

Year: 1995

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(94)00248-e

Authors: P.K McLarty, S Cristoloveanu, O Faynot, V Misra, J.R Hauser, J.J Wortman

Institutions: North Carolina State University, Centre National de la Recherche Scientifique, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2072096830

FWCI: 2.876

Cites: 5

Cited by: 92

Related to: 10