Work

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits

Year: 2007

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2006.884870

Authors: Bipul C. Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad A. Alam, Kaushik Roy

Institutions: Toshiba (United States), Purdue University West Lafayette

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2076372184

FWCI: 7.026

Cites: 20

Cited by: 80

Related to: 10