Work

Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control

Year: 1997

Type: article

Source: Nanotechnology

DOI: 10.1088/0957-4484/8/3a/008

Authors: A Gruverman, O Auciello, R Ramesh, H Tokumoto

Institutions: Argonne National Laboratory, University of Maryland, College Park

Language: English

Topic: Ferroelectric and Piezoelectric Materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2090466091

FWCI: 5.071

Cites: 16

Cited by: 128

Related to: 10