A generic low power scan chain wrapper for designs using scan compression
Year: 2010
Type: conference-paper
Source: IEEE VLSI Test Symposium (VTS)
Authors: Amit Sabne, Rajesh Tiwari, Abhijeet Shrivastava, Srivaths Ravi, Rubin Parekhji
Institutions: Bharat Heavy Electricals (India), Texas Instruments (India)
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2091305388