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Technique to determine the growth rate and resistivity of evaporated CdS thin films

Year: 1979

Type: article

Source: Journal of Vacuum Science and Technology

DOI: 10.1116/1.569913

Authors: N. K. Annamalai, C. C. Chao, D. Raymond

Institution: Clarkson University

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2094242559

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