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N.K. Annamalai

Observed names: N. Annamalai, N. K. Annamalai
Institution: Phillips Laboratory
OpenAlex ID: A5000416235
Radiation response of silicon on diamond (SOD) devices
1993 · N.K. Annamalai, J. Sawyer, et al. · IEEE Transactions on Nuclear Science · 36
Dielectric properties of amorphous Nb2O5 thin films
1975 · N. Fuschillo, B. Lalevic, et al. · Thin Solid Films · 32
Leakage currents in SOI MOSFETs
1988 · N.K. Annamalai, M.C. Biwer · IEEE Transactions on Nuclear Science · 18
A comparison of buried oxide characteristics of single and multiple implant SIMOX and bond and etch back wafers
1990 · N.K. Annamalai, J.F. Bockman, et al. · IEEE Transactions on Nuclear Science · 17
Hopping conduction in amorphous Nb2O5 thin films
1976 · N. Fuschillo, B. Lalevic, et al. · Journal of Non-Crystalline Solids · 14
Nonlinear high-field conductivity in Nb2O5 thin films
1974 · B. Lelevic, N. Fuschillo, et al. · Thin Solid Films · 13
Improvement of radiation hardness in fully-depleted SOI n-MOSFETs using Ge-implantation
1994 · Hua-Fang Wei, J.E. Chung, et al. · IEEE Transactions on Nuclear Science · 9
Buried-oxide charge trapping induced performance degradation in fully-depleted ultra-thin SOI p-MOSFET's
1996 · Hua-Fang Wei, J.E. Chung, et al. · IEEE Transactions on Electron Devices · 8
Switching phenomena and dielectric breakdown in amorphous Nb2O5 films
1976 · N. Fuschillo, B. Lalevic, et al. · Journal of Non-Crystalline Solids · 7
Schottky barriers effects on the dielectric behavior of the NbNb2O5Nb system
1976 · B. Lalevic, N. K. Annamalai · physica status solidi (a) · 6
Silicon-on-Diamond Technology
2005 · N.K. Annamalai, P. Fechner, et al. · IEEE International SOI Conference (SOI) · 4
2.12 Dielectric dispersion and polarization effects in thin transition metal oxide films
1977 · B. Lalevic, N. Annamalai, et al. · Vacuum · 4
Atomic implantation of Nb in amorphous Nb2O5 by rf sputtering
1975 · N. Fuschillo, B. Lalevic, et al. · Journal of Vacuum Science and Technology · 4
Silicon on Diamond (sod) Mosfets
2005 · P.C. Karulkar, N.K. Annamalai · IEEE International SOI Conference (SOI) · 3
Novel dielectrics for SOI structures
2002 · N.K. Annamalai, J. Chapski · IEEE SOS/SOI Technology Conference · 3
Properties of polycrystalline silicon grown on insulating substrates by electron beam gun evaporation
1987 · N.K. Annamalai, Nara Meyyappan, et al. · Thin Solid Films · 3
A numerical method to optimize collector grids
2003 · N.K. Annamalai, R.F. Blanchard, et al. · Biennial University/Government/Industry Microelectronics Symposium · 1
Buried oxide leakage current as a function of total dose
2003 · N.K. Annamalai, C. Surya, et al. · IEEE SOS/SOI Technology Conference · 1
Moisture Determination in IC Packages by Conductance Technique
1986 · N. K. Annamalai, S.M.R. Islam · IEEE International Reliability Physics Symposium proceedings · 1
Computer analysis of grids currently used for CdS/Cu2S solar cells
1979 · N.K. Annamalai, C. H. Kolbenson, et al. · Modeling and Simulation · 1
CdS - sputtered Cu2S solar cells
1976 · N.K. Annamalai · pvsp · 1
Total dose effects on buried oxide breakdown
2002 · N.K. Annamalai, W. Shedd, et al. · IEEE International SOI Conference (SOI)
Radiation Response of Diamond Films
1991 · N. K. Annamalai, Reginald F. Blanchard, et al. · NATO ASI series. Series B : Physics
A Method to Determine the Density of Surface States and Interfacial Charge Density in N-Channel Sos Mosfet's
1985 · N.K. Annamalai, A.N. Khondker · MRS Proceedings
Technique to determine the growth rate and resistivity of evaporated CdS thin films
1979 · N. K. Annamalai, C. C. Chao, et al. · Journal of Vacuum Science and Technology
Works count: 27
Citation count: 186
H-index: 8
I10-index: 6
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