Work

Total dose effects on buried oxide breakdown

Year: 2002

Type: conference-paper

Source: IEEE International SOI Conference (SOI)

DOI: 10.1109/soi.1991.162899

Authors: N.K. Annamalai, W. Shedd, J. Chapski, T. Kearney

Institutions: Rome Laboratory, Northeastern University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2153246774

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