Work

Effects of RRAM Stack Configuration on Forming Voltage and Current Overshoot

Year: 2011

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw.2011.5873225

Authors: D. C. Gilmer, G. Bersuker, H.-Y. Park, C. Park, B. Butcher, W. Wang, P. D. Kirsch, R. Jammy

Institutions: State University of New York, University at Albany, State University of New York

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2099323974

FWCI: 12.31

Cites: 11

Cited by: 81

Related to: 10