Work

Faster defect localization in nanometer technology based on defective cell diagnosis

Year: 2007

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2007.4437604

Authors: Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y.S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann

Institutions: Mentor Graphics (United States), Taiwan Semiconductor Manufacturing Company (China), Taiwan Semiconductor Manufacturing Company (Taiwan), University of Iowa, Advanced Micro Devices (Canada)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2102372015

FWCI: 2.295

Cites: 20

Cited by: 40

Related to: 10