Work

Test Data Compression Using Dictionaries with Fixed-Length Indices

Year: 2007

Type: article

Authors: Lei Li, Krishnendu Chakrabarty

Institution: Duke University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2103274289

FWCI: 15.08

Cites: 25

Cited by: 81

Related to: 20