Work

The use of variable load for RF circuit testing

Year: 2008

Type: conference-paper

Source: International Conference on Signals and Electronic Systems

DOI: 10.1109/icses.2008.4673496

Authors: Piotr Kyziol, Damian Grzechca, Tomasz Golonek, Jerzy Rutkowski

Institution: Silesian University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2103468232

FWCI: 0.364

Cites: 7

Cited by: 4

Related to: 10