Work

Adaptive Alternate Analog Test

Year: 2012

Type: article

Source: IEEE Design & Test of Computers

DOI: 10.1109/mdt.2012.2205480

Authors: Haralampos-G. Stratigopoulos, Salvador Mir

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Joseph Fourier, Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Intel Corporation, Arizona State University

OpenAlex ID: W2104047485

FWCI: 5.906

Cites: 14

Cited by: 55

Related to: 10