Work

Characterizing sampling aperture of clocked comparators

Year: 2008

Type: conference-paper

Source: Symposium on VLSI Circuits

DOI: 10.1109/vlsic.2008.4585955

Authors: M. Jeeradit, J. Kim, B. Leibowitz, P. Nikaeen, V. Wang, B. Garlepp, C. Werner

Institutions: Rambus (United States), Stanford University, University of California, Los Angeles

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2105436682

FWCI: 2.838

Cites: 5

Cited by: 33

Related to: 10