Work

NIM: a noise index model to estimate delay discrepancies between silicon and simulation

Year: 2010

Type: article

Source: Design, Automation, and Test in Europe

DOI: 10.5555/1870926.1871256

Authors: Elif Alpaslan, Jennifer Dworak, B. Kruseman, Ananta K. Majhi, Wilmar Heuvelman, Paul van de Wiel

Institutions: Brown University, NXP (Netherlands)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2105986757

FWCI: 0.735

Cites: 20

Cited by: 3

Related to: 10