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Ananta K. Majhi

Observed names: Ananta K Majhi, Ananta Majhi
Institution: NXP (Netherlands)
OpenAlex ID: A5113662264
Power Supply Noise in Delay Testing
2006 · Jing Wang, D. M. H. Walker, et al. · IEEE International Test Conference (ITC) · 80
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects
2007 · Jeroen Geuzebroek, Erik Jan Marinissen, et al. · IEEE International Test Conference (ITC) · 66
On Performance Testing with Path Delay Patterns
2007 · Bram Kruseman, Ananta Majhi, et al. · IEEE VLSI Test Symposium (VTS) · 10
A genetic algorithm-based circuit partitioner for MCMs
1995 · Ananta K. Majhi, L.M. Patnaik, et al. · Microprocessing and Microprogramming · 6
Impact of Temperature on Test Quality
2010 · Lavanya Jagan, Camelia Hora, et al. · International Conference on VLSI Design · 5
NIM: a noise index model to estimate delay discrepancies between silicon and simulation
2010 · Elif Alpaslan, Jennifer Dworak, et al. · Design, Automation, and Test in Europe · 3
NIM- a noise index model to estimate delay discrepancies between silicon and simulation
2010 · Elif Alpaslan, Jennifer Dworak, et al. · Design, Automation, and Test in Europe · 3
A Novel Path Delay Fault Simulator Using Binary Logic
1996 · Ananta K. Majhi, James Jacob, et al. · VLSI design · 3
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Efficient Grouping of Fail Chips for Volume Yield Diagnostics
2009 · Lavanya Jagan, Ratan Deep Singh, et al. · International Conference on VLSI Design · 2
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test
2012 · Elif Alpaslan, Bram Kruseman, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
EmbeddedMulti-DetectATPG andItsEffectontheDetectionofUnmodeledDefects
2007 · J. Geuzebroek, Erik Jan Marinissen, et al.
Works count: 12
Citation count: 178
H-index: 5
I10-index: 3
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